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measurement: search

Handheld Engine Tachometer from Ono Sokki

The HT-6100 from Ono Sokki Technology Inc., Addison, IL, is a handheld engine tachometer that, when used in combination with one of the company's detectors, can measure rpms on virtually any engine type. The device is used for research and/or production measurement of rpm on gasoline and diesel engines and features a large 5-digit LCD with backlight, a measurement range of 120–20,000 rpm, a built-in peak hold function, trigger-level volume adjustment function, an over-range alarm, and the ability to capture up to 20 measurement values each time the memory switch is pressed. The tachometer can be used in the lab, on the production line, or during in-vehicle testing.

Measurement technique could aid solar panel development

TROY, N.Y.: Researchers at Rensselaer Polytechnic Institute have developed a measurement technique that will help scientists and companies map nanomaterials as they grow. The discovery could help create superior nanotechnologies and lead to the development of more efficient solar panels and increased magnetic data storage.

Handheld LCR Meter from Protek Test & Measurement

The Model Z580 from Protek Test & Measurement, Englewood, NJ, is a handheld 9V battery-powered LCR meter that provides 0.3% accuracy and a 5-digit dual LCD. The meter incorporates a built-in comparator for 4-bin sorting with pass or fail warning, open and short-circuit calibration, and auto ranging and range hold. Test frequencies include 100 Hz, 120 Hz, 1 kHz, and 10 kHz; test voltages are 0.1 V, 0.3 V, and 0.42 V; and circuit modes are series and parallel equivalent.

EV Group Introduces New Suite of Aligners and Measurement Systems for 3D IC and Other Advanced Semiconductor, MEMS and Nanotechnology Device Manufactu

The 'NT' Series Significantly Increases Both Alignment and Measurement Accuracy to Enable Better Device Performance and Lower Manufacturing Costs

NIST UC-Berkeley High-Precision, Quantum Measurement Lab

An $11 million grant from the National Institute of Standards and Technology (NIST) will help the University of California, Berkeley, build a state-of-the-art precision measurement laboratory in the planned new home for the astronomy department and part of the physics department.

EV Group Introduces New Suite of Aligners and Measurement Systems for 3D IC and Other Advanced Semiconductor, MEMS and Nanotechnology Device Manufacturing

PRNewswire/ -- EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today introduced the NT series -- a new, yet already field-proven suite of mask aligners, wafer-to-wafer (W2W) bond aligners and measurement systems -- to address increased demand for higher precision alignment accuracy. The shift to smaller geometries along with more feature-dense packages adds a host of challenges, surrounding precision alignment capabilities, which can greatly impact device failure intolerance and, ultimately, yield and cost. The new EVG-NT series offers dramatically increased alignment accuracy -- in the range of 1 um down to 0.1 um -- for the manufacture of advanced MEMS, compound semiconductor, silicon-based power, 3D IC and nanotechnology devices -- unlike anything el

EV Group Introduces New Suite Of Aligners And Measurement Systems For 3D IC And Other Advanced Semiconductor, MEMS And Nanotechnology Device Manufacturing

St. Florian, Austria - EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today introduced the NT series -- a new, yet already field-proven suite of mask aligners, wafer-to-wafer (W2W) bond aligners and measurement systems -- to address increased demand for higher precision alignment accuracy. The shift to smaller geometries along with more feature-dense packages adds a host of challenges, surrounding precision alignment capabilities, which can greatly impact device failure intolerance and, ultimately, yield and cost. The new EVG-NT series offers dramatically increased alignment accuracy -- in the range of 1 um down to 0.1 um -- for the manufacture of advanced MEMS, compound semiconductor, silicon-based power, 3D IC and nanotechnology devices -- unlike anyt

Malvern Showcases new Systems for Foreign Particle Determination, Protein Characterization and Rheology Measurement

Malvern Instruments will demonstrate a new application for foreign particle determination on filters, and will show new systems for protein characterization and rheology measurement at the 2008 AAPS Annual Meeting & Exposition (17-20 Nov, Atlanta, USA).

Fluke Hart Scientific Division Introduces First High-Accuracy Dual-Channel Handheld Thermometer for PRT, Thermocouple, and Thermistor Measurement

Fluke Hart Scientific Division Introduces First High-Accuracy Dual-Channel Handheld Thermometer for PRT, Thermocouple, and Thermistor Measurement

Measurement guidelines for out-of-home video

Development of Average Unit Audience metric hailed an ‘important coming of age event for this medium’

Precise Measurement Of Phenomenon Advances Solar Cell Understanding

Researchers at Washington University in St. Louis have shed light on a basic process that could improve future solar cells.

Precise measurement of phenomenon advances solar cell understanding

Nov. 18, 2008 -- Researchers at Washington University in St. Louis have shed light on a basic process that could improve future solar cells.

New Measurement Technique Help Scientists Map Nanomaterial Growth

Bodycote Thermal Processing provide a wide range of industries with premium heat treatments and metal joining services

New measurement technique maps nanomaterials as they grow

Physicists overcome roadblock to using nano-electro-mechanical systems for digital logic and memory applications

Keynote expands mobile test and measurement network

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EV Group Introduces New Suite of Aligners and Measurement Systems

Applied Materials' New Enabler E5 System Solves Critical Contact Etch Challenges for 32nm Memory Chips

EV Group Introduces New Suite of Aligners and Measurement Systems for the MEMS, Nanotechnology and Semiconductor Markets

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NIST Awards $24 Million in Grants For New Research Facilities Dedicated to Quantum Measurement, Marine Ecology

The National Institute of Standards and Technology (NIST) announced today that it is awarding grants totaling more than $24 million to three universities to provide cost-shared support for the construction of new scientific research facilities. The winning projects were chosen from 93 applicants in a special competition announced last spring.

UC Berkeley awarded $11 million for new Center for Integrated Precision and Quantum Measurement

The Hastings Center and National University of Singapore join forces in bioethics scholarship and launch new journal

Fluke Hart Scientific Division Introduces First High-Accuracy Dual-Channel Handheld Thermometer for PRT, Thermocouple, and Thermistor Measurement

Morning Movers 11/03: VeraSun (VSE) Sinks On Bankrupcty; Goodyear (GT) and Oshkosh (OSK) Up On Results

Performing Bluetooth RF Radio Testing

Measurement and analysis of Bluetooth RF radios require a mix of instruments and approaches some of which are not called out in the standards documentation.

Online shopping spend in decline

US net measurement firm comScore found that online shopping was in decline for the first time since it began measuring it in 2001.

Carlson Selling Patents

GPRS Network Optimization Measurement Challenges Using Drive Testing - by Agilent Technologies Inc. 6/25/2003

Just Scratching The Surface: New Technique Maps Nanomaterials as They Grow

Researchers at Rensselaer Polytechnic Institute have developed a measurement technique that will help scientists and companies map nanomaterials as they grow. The discovery could help create superior nanotechnologies and lead to the development of more efficient solar panels and increased magnetic data storage. Full Story

Just Scratching The Surface: New Technique Maps Nanomaterials As They Grow

Researchers at Rensselaer Polytechnic Institute have developed a measurement technique that will help scientists and companies map nanomaterials as they grow. The discovery could help create superior nanotechnologies and lead to the development of more efficient solar panels and increased magnetic data storage.


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